Plasens-VIS
PLASENS-VIS
Nano Film Automated Optical Inspection
Incident photons with different quanta can preceptibly excite relaxed electron of nano films at very spesific angle. High energy photons after interaction with low energy electron scatter to a different path with lower energy. Also,they carry the information about the deposited nano layer of a known or unknown material over the film. Broad band spectroscopy of reflected visible light from different angle is a strong way to study spectrum response ofnano-structures and multi nano-layer of materials.
COMPREHENSIVE OPTICAL REFLECTION and TRANSMISSION CHARACTERIZATION of THIN FILM
this machine practically is an automated version of the famous kretschmann-otto optical configaration. visible spectroscopy of the nano structures of any kind (including different state of matter) is a low-cost and feasible way to study the material science. the fact behind this type of spectroscopy is the visible light and nano-materials are in the same regional size physically. thus, only optical properties such as reflection and transmission effectively describe nano-feature of nano-films.
EASY to USE and GRAPHICAL PLASENCE SYSTEM
Plasens Measurement Principle
GRTC : (General Reflection Transmaission Characterization)
1) Polarized reflective spectrum sweeper with steps from 0.1 to 0.5 degrees and a sweep range of 10-70 degrees.
2) Extraction of radiation spectrum for transparent and translucent films.
IMPS - i : (Internal Memory Projects i)
Simultaneous loading of several graphs from different GRTC projects in one graph and comparing spectral changes.
ERAC : (Especial Reflection Angle Characterisation)
Characterization of spectral ellipsometry based on polarized reflected light waves.
IMPS - ii : (Internal Memory Projects ii)
Simultaneous loading of several graphs from different ERAC projects in one graph and comparing spectral changes.
AUTOMATED OPYICAL STAGE
Main Features
1. Thin film: transparent at acceptable size of 1.8*1.8*0.05 cm.
2. System measurement mode : Reflection and transmission.
3. Sweeping mode(general):
Window size : 10-70 degree.
Sweeping step size : 0.1 -0.5 degree.
4. Sweeping mode (especific):
Window size: 1-4 degree.
Step size: 0.05 degree.
Sweeping size: 10-70 degree.
5. Polarization status: automaticall swap between s- or p- wave.
6. Prism type: semi-circular with refractive index of 1.6.
7. Light source: broad band (450-800 nm).
8. Spectrometer: visible range (350-800 nm) with 1 nm resolution.
9. Sample holder: replaceable respecting to measurement mode.
SELECTED PLASENS SOFTWARE FEATURES
User Friendly Panel and Fast Processing Measurements
Angle Sweeping with step of 0.05 degree
Plotting Ellipsometry components
Smoothing and noise filtering of Measured data
Broadband optical source and spectrometer device automation controlling panel